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29 Results for 'Microscopy'
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Technology
Mechanical Force Detection of Magnetic Fields Using Heterodyne Demodulation
Although detecting high-frequency magnetic fields is important in MRI, NMR and magnetic resonance force microscopes, it is more difficult to design magnetic field sensors at high frequencies (greater ...
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Daniel van der Weide, Charles Paulson, Thomas Grist, Modhurin Banerjee | P04127US
Technology
Plastic Cantilevers for Atomic Force Microscopy
The atomic force microscope (AFM), one of many types of scanned-proximity probe microscopes, images a sample by lightly touching it with a probe tip attached to the end of an extremely flexible leaf s...
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Daniel van der Weide, Andrew Stevens, Charles Paulson | P04378US
Technology
Microcoaxial Probes Made from Strained Semiconductor Bilayers
Atomic force microscopes (AFM), scanning tunneling microscopes (STM) and scanning microwave microscopes are three different instruments used to create images of nano-structures. Currently, the three i...
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Robert Blick | P04007US
Technology
Method of Producing Short-Wavelength Quantum-Entangled Light Beams
Quantum-entanglement is a phenomenon in which the quantum states of two objects become correlated and remain correlated, even when the objects are physically separated from each other. Quantum-entangl...
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Mark Saffman, Oo-Kaw Lim | P07323US