Wisconsin Alumni Research Foundation

Technology

Efficient Statistical Timing Analysis of Circuits

For integrated circuits, including very large scale integration (VLSI) circuits, to work properly, the signals traveling along the gates and interconnects must be properly timed. Using classical case ...
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Lizheng Zhang, Chung-Ping Chen, Yu Hen Hu | P04377US

Technology

Progressive Random Access Scan Circuitry

Very large scale integrated (VLSI) circuits are tested before use to evaluate reliability and performance. The two most common testing methods are serial-scan and random access scan (RAS). The serial...
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Kewal Saluja, Dong Hyun Baik | P06048US

Technology

Directed Assembly of Triblock Copolymers

The current art of nanoscale manufacturing uses self-assembling diblock copolymers to replicate a chemical pattern upwards. This method may be used to replicate a chemical pattern over a large area. H...
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Paul Nealey, Juan DePablo, Frank Bates | P06113US

WARF